@conference {Fortunato2001146,
	title = {Thin film metal oxide semiconductors deposited on polymeric substrates},
	booktitle = {Materials Research Society Symposium Proceedings},
	volume = {685},
	year = {2001},
	note = {<p>cited By 0</p>
},
	pages = {146-151},
	abstract = {<p>Highly textured transparent conducting ZnO:Al thin films have been prepared by r.f. magnetron sputtering. The films were deposited on polyester (Mylar type D, 100 μm thickness) and glass substrates at room temperature. Surface stylus profiling, X-ray diffraction, scanning electron microscopy, transmission electron microscope and Hall effect measurements as a function of temperature, using the van der Pauw technique have characterized the films. The samples are polycrystalline with a hexagonal wurtzite structure and a strong crystallographic c-axis orientation (002) perpendicular to the substrate surface (columnar structure). The ZnO:Al thin films with a resistivity as low as 3.6{\texttimes}10-2 Ωcm have been obtained, as deposited. {\textcopyright} 2001 Materials Research Society.</p>
},
	url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-34249894185\&partnerID=40\&md5=94f90527bf9fda27a5836d6af67bbd1c},
	author = {Fortunato, E.a , Nunes, P.a , Marques, A.a , Costa, D.a , {\'A}guas, H.a , Ferreira, I.a , Costa, M.E.V.b , Martins, R.a}
}
