@article {{\'A}guas2008880,
	title = {Spectroscopic ellipsometry study of Co-doped TiO 2 films},
	journal = {Physica Status Solidi (A) Applications and Materials Science},
	volume = {205},
	number = {4},
	year = {2008},
	note = {<p>cited By 4</p>
},
	pages = {880-883},
	abstract = {<p>Co-doped TiO 2 films were characterized by spectroscopic ellipsometry to determine their thickness, deposition rate and optical properties as function of substance temperature and background gas composition. To fit the data we used a combination of a single Tauc-Lorentz oscillator with the Drude free electron model to take in account the free electrons present in the film. The Co doping and addition of H 2 to the gas phase during film growth cause the formation of a titanium oxide which containsfree electrons that absorb the energy of the red part of the spectrum, causing k to increase. The n of the film at 1.5 eV is about 2.3 eV. The fittings also show that the n of films decreases and k increase at the surface. This can be related to a segregation of Co to the surface, which in some cases, of high substrate temperature and high H 2 flow during deposition, can lead to and even higher concentration of free electrons at the surface. {\textcopyright} 2008 WILEY-VCH Verlag GmbH \&amp; Co. KGaA.</p>
},
	doi = {10.1002/pssa.200777843},
	url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-54949141872\&partnerID=40\&md5=bfd6a3a0a043ba48c83fdb9ccbc0d678},
	author = {{\'A}guas, H.a , Popovici, N.b , L Pereiraa , Conde, O.b , Branford, W.R.c , Cohen, L.F.c , Fortunato, E.a , Martins, R.a}
}
