<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">O. M. N. D. Teodoro</style></author><author><style face="normal" font="default" size="100%">Catarino, M.I.S.</style></author><author><style face="normal" font="default" size="100%">Moutinho, A M C</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">{Wien-filtered Cs+ beam for SIMS: source description}</style></title><secondary-title><style face="normal" font="default" size="100%">Applied Surface Science</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">1993</style></year><pub-dates><date><style  face="normal" font="default" size="100%">jun</style></date></pub-dates></dates><urls><web-urls><url><style face="normal" font="default" size="100%">http://linkinghub.elsevier.com/retrieve/pii/016943329390444G</style></url></web-urls></urls><volume><style face="normal" font="default" size="100%">70-71</style></volume><pages><style face="normal" font="default" size="100%">291–294</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">&lt;p&gt;A compact cesium ion source with a Wien filter is described. This source has been developed in order to produce a pure beam of cesium ions for positive SIMS analysis. The ions are produced by a surface ionization ion emitter. The initial beam is about 99% pure and the remaining 1% is removed via the Wien filter. An asymmetric einzel lens at the end provides the focusing of the beam on the target. A short description of the source is presented as well as the measured final beam characteristics.&lt;/p&gt;
</style></abstract><notes><style face="normal" font="default" size="100%">&lt;p&gt;n/a&lt;/p&gt;
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