@article {Teodoro1993a,
	title = {{Wien-filtered Cs+ beam for SIMS: source description}},
	journal = {Applied Surface Science},
	volume = {70-71},
	year = {1993},
	note = {<p>n/a</p>
},
	month = {jun},
	pages = {291{\textendash}294},
	abstract = {<p>A compact cesium ion source with a Wien filter is described. This source has been developed in order to produce a pure beam of cesium ions for positive SIMS analysis. The ions are produced by a surface ionization ion emitter. The initial beam is about 99\% pure and the remaining 1\% is removed via the Wien filter. An asymmetric einzel lens at the end provides the focusing of the beam on the target. A short description of the source is presented as well as the measured final beam characteristics.</p>
},
	issn = {01694332},
	doi = {10.1016/0169-4332(93)90444-G},
	url = {http://linkinghub.elsevier.com/retrieve/pii/016943329390444G},
	author = {O. M. N. D. Teodoro and Catarino, M.I.S. and Moutinho, A M C}
}
