@article {Teodoro2002a,
	title = {{Work Function Microscopy as a Tool for Materials Analysis}},
	journal = {Key Engineering Materials},
	volume = {230-232},
	year = {2002},
	note = {<p>n/a</p>
},
	pages = {165{\textendash}168},
	abstract = {<p>n/a</p>
},
	keywords = {a focused electron or, abstract, an external, analysis apparatus to, Electrons, in this work, ion beam may be, Metals, Microscopy, of a multitechnique surface, perform work function microscopy, surface analysis, the onset method was, used to measure de, used to produce secondary, we describe the upgrading, work function},
	author = {O. M. N. D. Teodoro and Moutinho, A M C}
}
