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Cardoso, T., P. Pereira, V. Fernao Pires, and J. F. Martins, "Power quality and long life education", Industrial Electronics (ISIE), 2014 IEEE 23rd International Symposium on, Istanbul - Turkey, pp. 2224 - 2228, 2014/06. Abstract

This paper presents a remote laboratory linked with mobile devices for real data analysis on the field of power quality. A global system was developed from the power quality analyzer into the human machine interface devoted to the m-learning system. This m-learning system is intended to be used in a long life learning perspective. The developed remote laboratory is a good opportunity for people, even without deep knowledge on the field, to learn power quality principles in an applied way. Since the system is based on real data, is a good approach to give trainees practical knowledge on the field.

Cardoso, T., P. Pereira, V. Fernaao Pires, and J. F. Martins, "Android-based m-learning remote system for mobile power quality assessment in large buildings with renewable energies", Power Engineering, Energy and Electrical Drives (POWERENG), 2015 IEEE 5th International Conference on, Riga, Latvia, pp. 431-434, May, 2015. Abstract

Power Quality is a generic term focusing on several issues, going from reliability to the quality of service provided by the energy supplier. It addresses limiting aspects such as harmonic distortion, flicker, sags, swells and transients... It is important for the students to understand the differences between the large amounts of events that fit into poor power quality category. Moreover it is important for them to analyze real time non-laboratory events. To provide this experience to the students this paper presents a remote m-learning experimental system where several types of poor power quality events can be tested. The developed system is based on a power quality analysis distributed network and can be remotely accessed from a remote computer or smart phones.

Coito, F., H. Fino, and P. Pereira, "Variability-Aware Optimization of RF Integrated Inductors in Nanometer-Scale Technologies", Integrated Circuits for Analog Signal Processing, New York, Springer-Verlag, pp. 271-287, 2013. Abstract

Progressive scaling of CMOS technology towards nanoscale regime enables the design of highly integrated systems for the wireless communications market. As technology continues to scale, the variability in process parameters may cause significant deviations in device behaviour. The complexity of designing spiral inductors has lead to the development of multi-objective optimization based design methodologies yielding the generation of Pareto-optimal surfaces. However, the variability of the process parameters is usually ignored, yielding the selection of ideally optimal solutions in detriment of quasi-optimal solutions that may prove to be better, should the robustness against process parameter variation be accounted for. We propose the generation of an extended Pareto front containing both optima and quasi-optima solutions. Finally information on the robustness to process parameter variations, is used for electing the best design solutions.The evaluation of the extended set of sub-optima solutions requires methods capable to find the set of local optima, since solutions that are close to each other in the performance index space may be very distant in the design parameter space.