@article {8005,
	title = {Low temperature processed hafnium oxide: Structural and electrical properties},
	journal = {Materials Science in Semiconductor Processing},
	volume = {9},
	number = {6},
	year = {2006},
	note = {<p>Times Cited: 21Symposium on Characterization of High-K Dielectric Materials held at the 2006 E-MRS Spring MeetingMay 29-jun 02, 2006Nice, FRANCEEuropean Mat Res Soc</p>
},
	month = {Dec},
	pages = {1125-1132},
	abstract = {n/a},
	isbn = {1369-8001},
	url = {<Go to ISI>://WOS:000244261600049},
	author = {Pereira, L. and Barquinha, P. and Fortunato, E. and Martins, R.}
}
