@article {7973,
	title = {Gate-bias stress in amorphous oxide semiconductors thin-film transistors},
	journal = {Applied Physics Letters},
	volume = {95},
	number = {6},
	year = {2009},
	note = {<p>Times Cited: 91</p>
},
	month = {Aug 10},
	abstract = {n/a},
	isbn = {0003-6951},
	url = {<Go to ISI>://WOS:000269060600070},
	author = {Lopes, M. E. and Gomes, H. L. and Medeiros, M. C. R. and Barquinha, P. and Pereira, L. and Fortunato, E. and Martins, R. and Ferreira, I.}
}
