@article {7928,
	title = {Operational stability of solution based zinc tin oxide/SiO2 thin film transistors under gate bias stress},
	journal = {Apl Materials},
	volume = {3},
	number = {6},
	year = {2015},
	note = {<p>Times Cited: 1</p>
},
	month = {Jun},
	abstract = {n/a},
	isbn = {2166-532X},
	url = {<Go to ISI>://WOS:000357608900027},
	author = {Kiazadeh, Asal and Salgueiro, Daniela and Branquinho, Rita and Pinto, Joana and Gomes, Henrique L. and Barquinha, Pedro and Martins, Rodrigo and Fortunato, Elvira}
}
