@article {Bahubalindruni201530, title = {A-GIZO TFT neural modeling, circuit simulation and validation}, journal = {Solid-State Electronics}, volume = {105}, year = {2015}, note = {

cited By 1

}, pages = {30-36}, abstract = {

Development time and accuracy are measures that need to be taken into account when devising device models for a new technology. If complex circuits need to be designed immediately, then it is very important to reduce the time taken to realize the model. Solely based on data measurements, artificial neural networks (ANNs) modeling methodologies are capable of capturing small and large signal behavior of the transistor, with good accuracy, thus becoming excellent alternatives to more strenuous modeling approaches, such as physical and semi-empirical. This paper then addresses a static modeling methodology for amorphous Gallium-Indium-Zinc-Oxide - Thin Film Transistor (a-GIZO TFT), with different ANNs, namely: multilayer perceptron (MLP), radial basis functions (RBF) and least squares-support vector machine (LS-SVM). The modeling performance is validated by comparing the model outcome with measured data extracted from a real device. In case of a single transistor modeling and under the same training conditions, all the ANN approaches revealed a very good level of accuracy for large- and small-signal parameters (gm and gd), both in linear and saturation regions. However, in comparison to RBF and LS-SVM, the MLP achieves a very acceptable degree of accuracy with lesser complexity. The impact on simulation time is strongly related with model complexity, revealing that MLP is the most suitable approach for circuit simulations among the three ANNs. Accordingly, MLP is then extended for multiple TFTs with different aspect ratios and the network implemented in Verilog-A to be used with electric simulators. Further, a simple circuit (inverter) is simulated from the developed model and then the simulation outcome is validated with the fabricated circuit response. {\textcopyright} 2014 Elsevier Ltd . All rights reserved.

}, doi = {10.1016/j.sse.2014.11.009}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84920169995\&partnerID=40\&md5=d5e0ec76520067da9db9b174cefe8172}, author = {Bahubalindruni, P.G.a , Tavares, V.G.a , Barquinha, P.b , Duarte, C.a , Cardoso, N.a , De Oliveira, P.G.a , Martins, R.b , Fortu} } @article {Bahubalindruni2015547, title = {Analog circuits with high-gain topologies using a-GIZO TFTs on glass}, journal = {IEEE/OSA Journal of Display Technology}, volume = {11}, number = {6}, year = {2015}, note = {

cited By 3

}, pages = {547-553}, abstract = {

This paper presents analog building blocks that find potential applications in display panels. A buffer (source-follower), subtractor, adder, and high-gain amplifier, employing only n-type enhancement amorphous gallium-indium-zinc-oxide thin-film transistors (a-GIZO TFTs), were designed, simulated, fabricated, and characterized. Circuit simulations were carried out using a neural model developed in-house from the measured characteristics of the transistors. The adder-subtractor circuit presents a power consumption of 0.26 mW, and the amplifier presents a gain of 34 dB and a power consumption of 0.576 mW, with a load of 10 MΩ16 pF. To the authors{\textquoteright} knowledge, this is the highest gain reported so far for a single-stage amplifier with a-GIZO TFT technology. {\textcopyright} 2015 IEEE.

}, doi = {10.1109/JDT.2014.2378058}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84929315401\&partnerID=40\&md5=7642a5fe8721890faf514bcf85953ca4}, author = {Bahubalindruni, P.G.a , Silva, B.a , Tavares, V.G.a , Barquinha, P.b , Cardoso, N.a , Guedes De Oliveira, P.a , Martins, R.b , F} } @article {Neves20124381, title = {Aluminum doped zinc oxide sputtering targets obtained from nanostructured powders: Processing and application}, journal = {Journal of the European Ceramic Society}, volume = {32}, number = {16}, year = {2012}, note = {

cited By 27

}, pages = {4381-4391}, abstract = {

This work reports the production of ceramic targets based on nanostructured Al-doped ZnO (AZO) powders for sputtering applications. The nanostructured powder is obtained by a new patented process based on the detonation of an emulsion containing both Zn and Al metal precursors in the final proportion of 98:2wt\% (ZnO:Al 2O 3), through which the Al contains is highly uniform distributed over ZnO. Due to the nanostructured powder characteristics, the targets can be sintered at substantially lower temperatures (1150-1250{\textdegree}C) by conventional sintering, contributing to production costs reduction of ceramic targets and consequently the costs of photovoltaic and displays industries. Electrical resistivity values around 3.0-7.0{\texttimes}10 -3Ωcm have been obtained depending on final microstructure of the targets. The electro-optical properties of the films produced at room temperature with thicknesses around 360nm, besides being highly uniform exhibit a resistivity of about 1{\texttimes}10 -3Ωcm and a transmittance in the visible range above 90\%. {\textcopyright} 2012 Elsevier Ltd.

}, doi = {10.1016/j.jeurceramsoc.2012.08.007}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84866839575\&partnerID=40\&md5=83afb5f2dc54eeddeb0744800219c701}, author = {Neves, N.a b , Barros, R.a b , Antunes, E.a , Calado, J.a , Fortunato, E.b , Martins, R.b , Ferreira, I.b} } @article {Contreras2012812, title = {Amorphous silicon position sensitive detector array for fast 3-d object profiling}, journal = {IEEE Sensors Journal}, volume = {12}, number = {4}, year = {2012}, note = {

cited By 5

}, pages = {812-820}, abstract = {

A 32/128 linear array of 1-D amorphous silicon position sensitive detectors (PSD) was integrated into a self constructed suitable and portable data acquisition prototype system. The system is comprised by a commercially available existing electronics module suitable for photodiode data acquisition operations and by another adapter module, which allows for removal and replacement of the 32/128 PSD based sensor. This system is applied for imaging 3-D objects using the triangulation principle with a sheet-of-light laser. The sensor array response obtained from the reflected light of the object was fed into an electronic readout system and the corresponding signals were analyzed using the relevant data algorithm. The obtained results show a sensor nonlinearity of about 4\%-7\%, a wide sensor/system dynamic range and a 3-D profile spatial resolution supplied by each sensor strip of 339 μm, which can easily be reduced to 8.5 μm and even further with appropriate software modifications. {\textcopyright} 2011 IEEE.

}, doi = {10.1109/JSEN.2011.2164398}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84856854043\&partnerID=40\&md5=5d80aca83e95799c99b8c298ed843035}, author = {Contreras, J.a , Idzikowski, M.b , Pereira, S.a , Filonovich, S.A.a , Fortunato, E.a , Martins, R.a , Ferreira, I.a} } @conference {Martins2011, title = {Away from silicon era: The paper electronics}, booktitle = {Proceedings of SPIE - The International Society for Optical Engineering}, volume = {7940}, year = {2011}, note = {

cited By 5

}, abstract = {

Today there is a strong interest in the scientific and industrial community concerning the use of biopolymers for electronic applications, mainly driven by low-cost and disposable applications. Adding to this interest, we must recognize the importance of the wireless auto sustained and low energy consumption electronics dream. This dream can be fulfilled by cellulose paper, the lightest and the cheapest known substrate material, as well as the Earth{\textquoteright}s major biopolymer and of tremendous global economic importance. The recent developments of oxide thin film transistors and in particular the production of paper transistors at room temperature had contributed, as a first step, for the development of disposable, low cost and flexible electronic devices. To fulfil the wireless demand, it is necessary to prove the concept of self powered devices. In the case of paper electronics, this implies demonstrating the idea of self regenerated thin film paper batteries and its integration with other electronic components. Here we demonstrate this possibility by actuating the gate of paper transistors by paper batteries. We found that when a sheet of cellulose paper is covered in both faces with thin layers of opposite electrochemical potential materials, a voltage appears between both electrodes - paper battery, which is also self-regenerated. The value of the potential depends upon the materials used for anode and cathode. An open circuit voltage of 0.5V and a short-circuit current density of 1μA/cm2 were obtained in the simplest structure produced (Cu/paper/Al). For actuating the gate of the paper transistor, seven paper batteries were integrated in the same substrate in series, supplying a voltage of 3.4V. This allows proper ON/OFF control of the paper transistor. Apart from that transparent conductive oxides can be also used as cathode/anode materials allowing so the production of thin film batteries with transparent electrodes compatible with flexible, invisible, self powered and wireless electronics. {\textcopyright} 2011 SPIE.

}, doi = {10.1117/12.879520}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-80051884757\&partnerID=40\&md5=165d73bb19cd7ccf9498fe260d0d426f}, author = {Martins, R., Br{\'a}s, B., Ferreira, I., Pereira, L., Barquinha, P., Correia, N., Costa, R., Busani, T., Gon{\c c}alves, A., Pimentel, A.} } @conference {Fortunato2007371, title = {Advanced materials for the next generation of thin film transistors}, booktitle = {IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings}, year = {2007}, note = {

cited By 1

}, pages = {371-373}, abstract = {

Staggered bottom gate transparent thin film transistors (TTFTs) have been produced by rf magnetron sputtering at room temperature, using amorphous indium-zinc-oxide (IZO) semiconductor, for the channel as well as for the drain and source regions. The obtained TTFTs operate in the enhancement mode with threshold voltages of 2.4 V, saturation mobility of 22.7 cm2/Vs, gate voltage swing of 0.44 V/dec and an ON/OFF current ratio of 7{\texttimes}10 7. The high performances presented by these TTFTs produced at room temperature, make these TFTs a promising candidate for flexible, wearable, disposable portable electronics as well as battery-powered applications.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-56049103340\&partnerID=40\&md5=7b06b5582006e90cd0e382768565e106}, author = {Fortunato, E., Barquinha, P., Pereira, L., Gon{\c c}alves, G., Martins, R.} } @article {Fortunato2007, title = {Amorphous IZO TTFTs with saturation mobilities exceeding 100 cm2/Vs}, journal = {Physica Status Solidi - Rapid Research Letters}, volume = {1}, number = {1}, year = {2007}, note = {

cited By 120

}, pages = {R34-R36}, abstract = {

In this paper we demonstrate the use of amorphous binary In2O3-ZnO oxides simultaneously as active channel layer and as source/drain regions in transparent thin film transistor (TTFT), processed at room temperature by rf sputtering. The TTFTs operate in the enhancement mode and their performances are thickness dependent. The best TTFTs exhibit saturation mobilities higher than 102 cm2/Vs, threshold voltages lower than 6 V, gate voltage swing of 0.8 V/dec and an on/off current ratio of 107. This mobility is at least two orders of magnitude higher than that of conventional amorphous silicon TFTs and comparable to or even better than other polycrystal-line semiconductors. {\textcopyright} 2007 Wiley-VCH Verlag GmbH \& Co. KGaA, Weinheim.

}, doi = {10.1002/pssr.200600049}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-36048988960\&partnerID=40\&md5=39e4c32491e99312b15ed435167d378a}, author = {Fortunato, E., Barquinha, P., Pimentel, A., Pereira, L., Gon{\c c}alves, G., Martins, R.} } @article {Martins2007, title = {Amorphous/nanocrystalline silicon biosensor for the specific identification of unamplified nucleic acid sequences using gold nanoparticle probes}, journal = {Applied Physics Letters}, volume = {90}, number = {2}, year = {2007}, note = {

cited By 34

}, abstract = {

Amorphous/nanocrystalline silicon p i' i i' n devices fabricated on micromachined glass substrates are integrated with oligonucleotide-derivatized gold nanoparticles for a colorimetric detection method. The method enables the specific detection and quantification of unamplified nucleic acid sequences (DNA and RNA) without the need to functionalize the glass surface, allowing for resolution of single nucleotide differences between DNA and RNA sequences-single nucleotide polymorphism and mutation detection. The detector{\textquoteright}s substrate is glass and the sample is directly applied on the back side of the biosensor, ensuring a direct optical coupling of the assays with a concomitant maximum photon capture and the possibility to reuse the sensor. {\textcopyright} 2007 American Institute of Physics.

}, doi = {10.1063/1.2431449}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-33846205122\&partnerID=40\&md5=fcfb8594ac2767ebd479cb88976a5c35}, author = {Martins, R.a , Baptista, P.b , Raniero, L.a c , Doria, G.b , Silva, L.a , Franco, R.d , Fortunato, E.a} } @article {Contreras20061792, title = {Amorphous silicon position sensitive detectors applied to micropositioning}, journal = {Journal of Non-Crystalline Solids}, volume = {352}, number = {9-20 SPEC. ISS.}, year = {2006}, note = {

cited By 11

}, pages = {1792-1796}, abstract = {

The position of a 40 μm wide by 400 μm long cantilever in a microscope was detected by a 32 lines array of 1D amorphous silicon position sensitive detectors (PSD). The sensor was placed in the ocular used for the CCD camera of a microscope and the alignment, focusing and positioning of the cantilever was achieved using the X-Y-Z translation table of the microscope that has a micrometer resolution controller. In this work we present results concerning the micro positioning of a cantilever and its holding structure through the reflected light that is detected by 1D/3D psd and converted to an analog signal proportional to the movement. The signal given by the 32 sensor array was analyzed directly without any electronic readout system or data algorithm. The obtained results show a linear behavior of the photovoltage relating X and Y movement, a non-linearity less than 2\% and spatial resolution of 600 μV/μm. {\textcopyright} 2006 Elsevier B.V. All rights reserved.

}, doi = {10.1016/j.jnoncrysol.2006.02.026}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-33744531493\&partnerID=40\&md5=23d73589aeaa546e21a214de7c13b936}, author = {Contreras, J.a b , Baptista, C.a , Ferreira, I.a , Costa, D.a , Pereira, S.a , {\'A}guas, H.a , Fortunato, E.a , Martins, R.a , Wier} } @conference {Zhang2005679, title = {Amorphous silicon based p-i-i-n structure for color sensor}, booktitle = {Materials Research Society Symposium Proceedings}, volume = {862}, year = {2005}, note = {

cited By 0

}, pages = {679-683}, abstract = {

This work deals with the study of the role of the film thickness and composition on the color selectivity of the collecting spectrum of glass/ZnO:Ga/p-a-Si1-xCx:H/ a-Si1-x C x:H /a-Si:H/n-a-Si:H/Al photoelectronic detectors produced in a single chamber plasma enhanced chemical vapor deposition (PECVD) system. The cross contaminations were minimized by a rotate-cover substrate holder system. The devices can detect the blue illumination at small reverse bias and detect red illumination at large reverse bias. The role of the process parameters, especially the thickness of the p-type and intrinsic a-Si1-x C x:H, and the intrinsic a-Si:H layers on the device performances were studied in detail aiming to achieve a better detectivity. {\textcopyright} 2005 Materials Research Society.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-30644478525\&partnerID=40\&md5=6ebba0a3e556d7edb947ab66332b9847}, author = {Zhang, S., Raniero, L., Fortunato, E., Pereira, L., {\'A}guas, H., Ferreira, I., Martins, R.} } @article {Zhang2005268, title = {Amorphous silicon-based PINIP structure for color sensor}, journal = {Thin Solid Films}, volume = {487}, number = {1-2}, year = {2005}, note = {

cited By 5

}, pages = {268-270}, abstract = {

A series of hydrogenated amorphous silicon carbide (a-SiC:H) films was prepared by plasma enhanced chemical vapor deposition (PECVD) technology. The microstructure and photoelectronic properties of the film are investigated by absorption spectra (in the ultraviolet to near-infrared range) and Fourier transform infrared (FTIR) spectra. The results show that good band gap controllability (1.83-3.64 eV) was achieved by adjusting the plasma parameters. In the energy range around 2.1 eV, the a-Si1-xCx:H films exhibit good photosensitivity, opening the possibility to use this wide band gap material for device application, especially when blue color detectors are concerned. A multilayer device with a stack of glass/TCO(ZnO:Ga)/P(a-SiC:H)/I(a- SiC:H)/N(a-Si:H)/I(a-Si:H)/P(a-Si:H)/Al has been prepared. The devices can detect blue and red colors under different bias voltages. The optimization of the device, especially the film thickness and the band gap offset used to achieve better detectivity, is also done in this work. {\textcopyright} 2005 Elsevier B.V. All rights reserved.

}, doi = {10.1016/j.tsf.2005.01.077}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-22944462068\&partnerID=40\&md5=c076da3ee27928183d5d224af58c7db5}, author = {Zhang, S., Raniero, L., Fortunato, E., Ferreira, I., {\'A}guas, H., Martins, R.} } @article {Mei2004168, title = {Aqueous tape casting of low-k cordierite substrate: The influence of glass content}, journal = {Materials Science Forum}, volume = {455-456}, year = {2004}, note = {

cited By 1

}, pages = {168-171}, abstract = {

Thick films of cordierite-based glass ceramics were prepared by aqueous tape casting from suspensions containing 80-wt\% solids. The weight proportions of cordierite/glass ranged from 70/30 to 30/70 in order to investigate the effect of glass content on the rheological behaviour and on the microstructures and properties of the green tapes. Suspensions with 50 to 60-wt\% glass content exhibited the lowest viscosity values among all the slurries investigated, while the green tape containing 30-wt\% glass presented homogenous microstructures at both top and bottom surfaces, contrarily to the observations for the other compositions. The green densities increased with glass content. The sintered tapes (1150{\textdegree}C, 2h) containing 50 to 60-wt\% glass exhibited the lowest values for the dielectric constant (\~{}5.2) and dielectric loss (\~{}0.002) at 1MHz.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-17144449996\&partnerID=40\&md5=c17b5665288e9c4381f2783a1c3e6e4d}, author = {Mei, S.a , Yang, J.a , Ferreira, J.M.F.a , Martins, R.b} } @article {Pereira20021289, title = {a-Si:H interface optimisation for thin film position sensitive detectors produced on polymeric substrates}, journal = {Journal of Non-Crystalline Solids}, volume = {299-302}, number = {PART 2}, year = {2002}, note = {

cited By 14

}, pages = {1289-1294}, abstract = {

In this paper we present results concerning the optimisation of the electronic and mechanical properties presented by amorphous silicon (a-Si:H) thin films produced on polyimide (Kapton{\textregistered} VN) substrates with different thicknesses (25, 50 and 75 μm) by the plasma enhanced chemical vapour deposition (PECVD) technique. The purpose of this study is to obtain a low defect density as well as low residual stresses (specially at the interface) in order to provide good performances for large area (10 mm wide by 80 mm long) flexible position sensitive detectors. The electrical and optical properties presented by the films will be correlated to the sensor characteristics. The properties of samples have been measured by dark/photoconductivity, constant photocurrent measurements (CPM) and the results have been compared with films deposited on Corning 7059 glass substrates during the same run deposition. The residual stresses were measured using an active optical triangulation and angle resolved scattering. The preliminary results indicate that the thinner polymeric substrate with 25 μm presents the highest density of states, which is associated to the residual stresses and strains associated within the film. {\textcopyright} 2002 Elsevier Science B.V. All rights reserved.

}, doi = {10.1016/S0022-3093(01)01150-4}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0036530620\&partnerID=40\&md5=c8a0d3b449f231925488bb636d215f48}, author = {Pereira, L.a , Brida, D.a , Fortunato, E.a , Ferreira, I.a , {\'A}guas, H.a , Silva, V.a , Costa, M.F.M.b , Teixeira, V.b , Martins,} } @article {Teixeira200270, title = {Amorphous ITO thin films prepared by DC sputtering for electrochromic applications}, journal = {Thin Solid Films}, volume = {420-421}, year = {2002}, note = {

cited By 80

}, pages = {70-75}, abstract = {

Indium-Tin-Oxide (ITO) thin films were deposited on glass substrates using DC magnetron reactive sputtering at different bias voltages and substrate temperatures. Some improvements were obtained on film properties, microstructure and other physical characteristics for different conditions. Amorphous and polycrystalline films can be obtained for various deposition conditions. The transmission, absorption, spectral and diffuse reflection of ITO films were measured in some ranges of UV-Vis-NIR. The refractive index (n), Energy band gap Eg and the surface roughness of the film were derived from the measured spectra data. The carrier density (nc) and the carrier mobility (μ) of the film micro conductive properties were discussed. The films exhibited suitable optical transmittance and conductivity for electrochromic applications. {\textcopyright} 2002 Elsevier Science B.V. All rights reserved.

}, doi = {10.1016/S0040-6090(02)00656-9}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0037011145\&partnerID=40\&md5=6baae2ec8905087cd877c5acea90afef}, author = {Teixeira, V.a , Cui, H.N.a d , Meng, L.J.b , Fortunato, E.c , Martins, R.e} } @article {Fortunato199941, title = {Amorphous silicon thin films applied to photochemical sensors}, journal = {Vacuum}, volume = {52}, number = {1-2}, year = {1999}, note = {

cited By 2

}, pages = {41-44}, abstract = {

The present paper describes the properties of a photochemical sensor based on amorphous silicon MIS (Metal-Insulator-Semiconductor) diodes. The structure of the sensors used in this work are based on glass/Cr/a-SiH(n +)/a-Si:H(i)SiOx/Pd, where the amorphous silicon layers have been deposited by conventional plasma r.f. techniques. The proposed photochemical sensors present a 2-3 orders of magnitude change in the saturation current and a decrease of up to 40\% on the open circuit voltage when in the presence of 400 ppm of hydrogen. The overall performance of these sensors, associated with the low cost fabrication technology, suggests that, in the near future, it will be possible to use them in several industrial applications. {\textcopyright} 1998 Elsevier Science Ltd. All rights reserved.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032762163\&partnerID=40\&md5=8717278e64d5830ec47b7a9f7983c161}, author = {Fortunato, E., Malik, A., Martins, R.} } @article {Fortunato19981349, title = {Amorphous silicon sensors: From photo to chemical detection}, journal = {Journal of Non-Crystalline Solids}, volume = {227-230}, number = {PART 2}, year = {1998}, note = {

cited By 4

}, pages = {1349-1353}, abstract = {

This paper reports the performances of metal/insulator/semiconductor devices, simultaneously sensitive to hydrogen and to the visible region of the spectrum. The sensors used in this work are based on glass/Cr/a-SiH(n+)/a-Si:H(i)/SiOx/Pd structures, where the amorphous silicon was deposited by conventional r.f. techniques and the oxide grown thermally (in air) or chemically (in hydrogen peroxide). The proposed sensors present a response of \~{} 3 orders of magnitude change in the saturation current when in the presence of 400 ppm of hydrogen and an open circuit voltage that decreases in the presence of hydrogen, with a maximum spectral response at 500 nm. These sensors were also compared with equivalent crystalline silicon devices whose oxides were prepared exactly in the same conditions as the ones used for the a-Si:H devices. {\textcopyright} 1998 Elsevier Science B.V. All rights reserved.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032065116\&partnerID=40\&md5=0b3fc55c4a150e6000c52419d1ddb1be}, author = {Fortunato, E.a , Malik, A.a , S{\^e}co, A.b , Ferreira, I.a , Martins, R.a} } @article {Topi{\v c}19971377, title = {Analysis of front contact heterojunction in a-Si:H one-dimensional position sensitive detectors}, journal = {Review of Scientific Instruments}, volume = {68}, number = {3}, year = {1997}, note = {

cited By 1

}, pages = {1377-1381}, abstract = {

The influence of different transparent conducting oxides (TCO) on the transverse photoelectrical properties of one-dimensional position sensitive detectors based on p-i-n amorphous silicon structures was studied. For both SnO 2 and indium tin oxide, poor quality of the p layer was revealed by secondary ion mass spectroscopy measurements. Good agreement between experimental and simulation characteristics of TCO/p-i-n structure was additionally conditioned by a strong increase in defect states at the p layer surface which can be attributed to the reduction/ oxidation process at the TCO/p interface. However, the analysis showed that under reverse bias the spectral response of the p-i-n structure is not significantly affected by different TCO layers and conditions at the TCO/p heterojunction. Nevertheless, indium tin oxide is less appropriate for a front TCO layer due to the poor reverse dark current-voltage characteristic, i.e., higher leakage current component leading to lower signal to noise ratio. {\textcopyright} 1997 American Institute of Physics.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-4043100666\&partnerID=40\&md5=58c871dfe426c00db5785847a7176df1}, author = {Topi{\v c}, M.a , Smole, F.a , Furlan, J.a , Fortunato, E.b , Martins, R.b} } @article {Vieira19961193, title = {Amorphous and microcrystalline silicon p-i-n optical speed sensors based on the flying spot technique}, journal = {Journal of Non-Crystalline Solids}, volume = {198-200}, number = {PART 2}, year = {1996}, note = {

cited By 1

}, pages = {1193-1197}, abstract = {

From the flying spot technique (FST) the ambipolar diffusion length and the effective-lifetime of the carriers photogenerated by a moving light spot that strikes a p-i-n junction can be inferred. In this paper, those properties of a p-i-n junction are used together with an optical triangulation principle to determine the velocity of an object that is moving in the direction of a light source. The light reflected back from the object is analysed through an amorphous or a microcrystalline p-i-n structure. Its transient transverse photovoltage is dependent on the velocity of the object. A comparison between the performances of both kinds of devices is presented.

}, doi = {10.1016/0022-3093(96)00111-1}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0030563421\&partnerID=40\&md5=1f3acdf883c8050ac9d702a04b1cc33f}, author = {Vieira, M.a , Fantoni, A.a , Koynov, S.a b , Cruz, J.a , Ma{\c c}arico, A.a , Martins, R.a} } @conference {Vieira1994571, title = {a-Si:H optical speed detector based on the flying spot technique}, booktitle = {Conference Record of the IEEE Photovoltaic Specialists Conference}, volume = {1}, year = {1994}, note = {

cited By 0

}, pages = {571-574}, abstract = {

We have developed in the past a transient technique called Flying Spot Technique (FST)[1], based on the lateral photoeffect. It allows to determine the ambipolar diffusion length and the effective lifetime of the photogenerated carriers, once the light spot velocity and geometry of the structure are known. We propose to apply this technique backwards in order to detect the path and velocity of an object that is moving toward a light source direction. The light back reflected is analyzed by a p.i.n structure measuring the transient transverse photovoltage which is dependent on the object movement (position and velocity). Details concerning material characterization and device geometry will be presented.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0028717248\&partnerID=40\&md5=b8d9654e9404beed1040c9483c257eec}, author = {Vieira, M., Fantoni, A., Macarico, A., Soares, F., Martins, R.} } @conference {Vieira1994741, title = {AD-layer for spatial control of light induced degradation on pin devices}, booktitle = {Materials Research Society Symposium Proceedings}, volume = {336}, year = {1994}, note = {

cited By 0

}, pages = {741-746}, abstract = {

In this work we report experimental results on light induced metastability of a-Si: H p.i.n. devices with different microscopic/macroscopic structures and we discuss them in terms of improved stability through spatial control of charged defects grown during light exposure. By placing a thin (few A) intrinsic layer (i) between both p/i and i/n a-Si: H interfaces we are able to reduce the effective degradation rate through spatial modification of the electric field profile in the device. The electronic transport and the stability changes that accompany the change in microstructure (R) and hydrogen content (CH) of the i- and i'-layer, were monitored throughout the entire light induced degradation process and compared with the corresponding μT product (for both carriers) inferred through steady state photoconductivity and Flying Spot Technique (FST) measurements. Results show that the degradation rate is a function of CH and R of both layers and can be correlated with the density of microvoids and di-hydride bonding. Since the i'-layers have a higher CH bonded mainly as SiF2 radicals (R≈0.4), they act as an hindrance to the growth of the defect, in the active region, generating "gettering centers" whose localisation and density are tailored in such a way that they will control spatially the electric field profile during light exposure. Preliminary results show improvements in film{\textquoteright}s stability when the interfacial layer is included. So future progress toward more stable and efficient a-Si: H solar cells will depend on a careful engineering design of the devices. {\textcopyright} 1994 Materials Research Society.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84897710585\&partnerID=40\&md5=bb60a26fffd91aa7597c21b320760679}, author = {Vieira, M., Fantoni, A., Fortunato, E., Lavareda, G., Martins, R.} } @article {Fortunato19941151, title = {Application of thin film technology to optical sensors}, journal = {Vacuum}, volume = {45}, number = {10-11}, year = {1994}, note = {

cited By 0

}, pages = {1151-1154}, abstract = {

In this paper we present results of PIN single and dual axis Thin Film Position Sensitive Detectors (TFPSD) based on hydrogenated amorphous silicon (a-Si:H) technology, with a wide detection area (up to 80 {\texttimes} 80 mm). These sensors provide an alternative to Charge Coupled Devices (CCDs) when large inspection areas are needed, under a requirement to use simpler technology. In this paper we analyse the forward and reverse I-V characteristics in the dark and under illumination, as well as the device linearity of TFPSD. {\textcopyright} 1994.

}, doi = {10.1016/0042-207X(94)90050-7}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0028518220\&partnerID=40\&md5=9962cd611b69d4d800d325f7655bc641}, author = {Fortunato, E.a , Lavareda, G.a , Vieira, M.a , Martins, R.a , Ferreira, L.b} } @article {Vieira1991479, title = {A-Si:H ambipolar diffusion length and effective lifetime measured by flying spot (FST) and spectral photovoltage (SPT) techniques}, journal = {Journal of Non-Crystalline Solids}, volume = {137-138}, number = {PART 1}, year = {1991}, note = {

cited By 4

}, pages = {479-482}, abstract = {

On this paper we report the physical model that supports the theory of the Flying Spot Technique (FST). Through this technique it is possible to determine separately the ambipolar diffusion length (L*) and the effective lifetime (τ*) of the generated carriers, using either Schottky diodes or quasi-ohmic sandwich structures. We also report a new static method based on the Spectral Photovoltage (SPT) that allows to infer the ambipolar diffusion length and to estimate the surface recombination velocity. {\textcopyright} 1991 Elsevier Science Publishers B.V. All rights reserved.

}, doi = {10.1016/S0022-3093(05)80159-0}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0026415491\&partnerID=40\&md5=fff13bb5dcb3c9fb8af1aec6bb882d23}, author = {Vieira, M., Martins, R., Fortunato, E., Soares, F., Guimar{\~a}es, L.} } @conference {Martins1984778, title = {ANALYSIS OF A NEW PRODUCTION TECHNIQUE FOR AMORPHOUS SILICON SOLAR CELLS.}, booktitle = {Commission of the European Communities, (Report) EUR}, year = {1984}, note = {

cited By 0

}, pages = {778-782}, abstract = {

This new production technique is based on the growth of a-Si films on a reactor where gas decomposition promoted by a capacitively coupled r. f. power system takes place in a chamber separated from that where amorphous films are deposited under the action of an electromagnetic static field. Using this method, we shall reduce films contamination caused by the residual gas desorbed from reactor walls. At the same time, there is a reduction plasma ion and electron damages on the deposited films. The main species impinging upon our substrates will be mainly composed of long life radicals with high mobilities and high diffusion rates, which will give origin to a random silicon network free of long poly-silane chains.

}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0021655867\&partnerID=40\&md5=a9ed57ada367049ba6f12e184a305fb4}, author = {Martins, R., Guimaraes, L., Carvalho, N., Andrade, A.M., Corgnier, S.L.L., Sanematsu, M.S.} }