@article {Lopes2009,
	title = {{Gate-bias stress in amorphous oxide semiconductors thin-film transistors}},
	journal = {Applied Physics Letters},
	volume = {95},
	number = {6},
	year = {2009},
	note = {n/a},
	pages = {063502},
	abstract = {n/a},
	issn = {00036951},
	doi = {10.1063/1.3187532},
	url = {http://apps.isiknowledge.com/full\_record.do?product=UA\&search\_mode=GeneralSearch\&qid=11\&SID=Z1nIo6NpO6CoGE2nDij\&page=1\&doc=18},
	author = {Lopes, M. E. and Gomes, H. L. and Medeiros, M. C. R. and Barquinha, P. and Pereira, L. and Fortunato, E. and Martins, R. and Ferreira, I.}
}
