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Lopes, M. E., H. L. Gomes, M. C. R. Medeiros, P. Barquinha, L. Pereira, E. Fortunato, R. Martins, and I. Ferreira. "{Gate-bias stress in amorphous oxide semiconductors thin-film transistors}." Applied Physics Letters. 95 (2009): 063502. AbstractWebsite
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LGUAS, H. "{Effect of the tunnelling oxide thickness and density on the performance of MIS photodiodes}." Thin Solid Films. 451-452 (2004): 361-365. AbstractWebsite
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