A Fully Integrated and Reconfigurable Architecture for Coherent Self-Testing of High Speed Analog-to-Digital Converters | Luis Bica Oliveira

A Fully Integrated and Reconfigurable Architecture for Coherent Self-Testing of High Speed Analog-to-Digital Converters

Citation:: Santin, E., L. B. Oliveira, B. Nowacki, and J. Goes. "A Fully Integrated and Reconfigurable Architecture for Coherent Self-Testing of High Speed Analog-to-Digital Converters." Circuits and Systems I: Regular Papers, IEEE Transactions on. 58 (2011): 1531-1541.

Abstract:

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