<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">M Guerra</style></author><author><style face="normal" font="default" size="100%">P Amaro</style></author><author><style face="normal" font="default" size="100%">Szabo, C. I.</style></author><author><style face="normal" font="default" size="100%">Gumberidze, A.</style></author><author><style face="normal" font="default" size="100%">P. Indelicato</style></author><author><style face="normal" font="default" size="100%">J P Santos</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Analysis of the charge state distribution in an ECRIS Ar plasma using high-resolution x-ray spectra</style></title><secondary-title><style face="normal" font="default" size="100%">Journal of Physics B: Atomic, Molecular and Optical Physics</style></secondary-title><short-title><style face="normal" font="default" size="100%">JPS_Articles PTDC_FIS_117606_2010 PTDC_2014_TOP5</style></short-title></titles><dates><year><style  face="normal" font="default" size="100%">2013</style></year><pub-dates><date><style  face="normal" font="default" size="100%">Mar 01</style></date></pub-dates></dates><urls><web-urls><url><style face="normal" font="default" size="100%">http://iopscience.iop.org/0953-4075/46/6/065701/</style></url></web-urls></urls><number><style face="normal" font="default" size="100%">6</style></number><publisher><style face="normal" font="default" size="100%">IOP Publishing</style></publisher><volume><style face="normal" font="default" size="100%">46</style></volume><pages><style face="normal" font="default" size="100%">065701</style></pages><language><style face="normal" font="default" size="100%">English</style></language><abstract><style face="normal" font="default" size="100%">&lt;p&gt;In this work, we obtained a charge state distribution inside an Ar plasma produced by an electron–cyclotron-resonance ion source. The processes that lead to the observed lines in x-ray spectra are identified and included in the simulated x-ray spectrum. The geometrical constraints of the flat double crystal spectrometer, used to measure the x-ray spectrum, are investigated as they are crucial for correctly obtaining the ion densities from the observed transition amplitudes. Multiple electron impact ionization is included, and a realistic electron velocity distribution is taken into account. The charge state distribution of the Ar ions is compared to measured extracted ionic currents.&lt;/p&gt;
</style></abstract><notes><style face="normal" font="default" size="100%">n/a</style></notes><custom3><style face="normal" font="default" size="100%">papers3://publication/uuid/8CE1D74D-C517-493E-BDEF-060EC5233A82</style></custom3><label><style face="normal" font="default" size="100%">r05317</style></label></record></records></xml>