@article {8134,
	title = {Analysis of the charge state distribution in an ECRIS Ar plasma using high-resolution x-ray spectra},
	journal = {Journal of Physics B: Atomic, Molecular and Optical Physics},
	volume = {46},
	number = {6},
	year = {2013},
	note = {n/a},
	month = {Mar 01},
	pages = {065701},
	publisher = {IOP Publishing},
	abstract = {<p>In this work, we obtained a charge state distribution inside an Ar plasma produced by an electron{\textendash}cyclotron-resonance ion source. The processes that lead to the observed lines in x-ray spectra are identified and included in the simulated x-ray spectrum. The geometrical constraints of the flat double crystal spectrometer, used to measure the x-ray spectrum, are investigated as they are crucial for correctly obtaining the ion densities from the observed transition amplitudes. Multiple electron impact ionization is included, and a realistic electron velocity distribution is taken into account. The charge state distribution of the Ar ions is compared to measured extracted ionic currents.</p>
},
	url = {http://iopscience.iop.org/0953-4075/46/6/065701/},
	author = {M Guerra and P Amaro and Szabo, C. I. and Gumberidze, A. and P. Indelicato and J P Santos}
}
