<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Pereira, L.</style></author><author><style face="normal" font="default" size="100%">Aguas, H.</style></author><author><style face="normal" font="default" size="100%">Fortunato, E.</style></author><author><style face="normal" font="default" size="100%">Martins, R.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Nanostructure characterization of high k materials by spectroscopic ellipsometry</style></title><secondary-title><style face="normal" font="default" size="100%">Applied surface science</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2006</style></year></dates><number><style face="normal" font="default" size="100%">1</style></number><publisher><style face="normal" font="default" size="100%">North-Holland</style></publisher><volume><style face="normal" font="default" size="100%">253</style></volume><pages><style face="normal" font="default" size="100%">339–343</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">n/a</style></abstract><notes><style face="normal" font="default" size="100%">n/a</style></notes></record></records></xml>