Very low frequency dielectric relaxation deduced from time domain measurements

Citation:
Neagu, E. R., J. N. Marat-Mendes, C. J. Dias, R. Neagu, and T. Vieira. "Very low frequency dielectric relaxation deduced from time domain measurements." Advanced Materials Forum I. Vol. 230-2. 2002. 579-582.

Abstract:

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Notes:

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