The determination of the metal-dielectric interface barrier height from the open-circuit isothermal charging current | Carlos Jorge Miranda Dias

The determination of the metal-dielectric interface barrier height from the open-circuit isothermal charging current

Citation:: Neagu, E. R., R. M. Neagu, C. J. Dias, Carmo M. Lanca, and J. N. Marat-Mendes. "The determination of the metal-dielectric interface barrier height from the open-circuit isothermal charging current." Journal of Applied Physics. 104 (2008).

Abstract:

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