Martins, Rui M. S., N. Schell, H. Reuther, L. Pereira, R. J. C. Silva, K. K. Mahesh, Braz F. M. Fernandes, AT Marques, AF Silva, APM Baptista, C. Sa, FJLA Alves, LF Malheiros, and M. Vieira. "
Characterization of Ni-Ti (Shape Memory Alloy) Thin Film by in-situ XRD and Complementary ex-situ Techniques."
Advanced Materials Forum Iv. Vol. 587-588. 2008. 672-676.
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Aguas, H., L. Pereira, A. Goullet, R. Silva, E. Fortunato, R. Martins, JR Abelson, G. Ganguly, H. Matsumura, J. Robertson, and EA Schiff. "
Correlation between the tunnelling oxide and I-V curves of MIS photodiodes."
Amorphous and Nanocrystalline Silicon-Based Films-2003. Vol. 762. 2003. 217-222.
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Martins, Rui M. S., M. Beckers, A. Muecklich, N. Schell, R. J. C. Silva, K. K. Mahesh, Braz F. M. Fernandes, AT Marques, AF Silva, APM Baptista, C. Sa, FJLA Alves, LF Malheiros, and M. Vieira. "
The Interfacial Diffusion Zone in Magnetron Sputtered Ni-Ti Thin Films Deposited on Different Si Substrates Studied by HR-TEM."
Advanced Materials Forum Iv. Vol. 587-588. 2008. 820-823.
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