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Kiazadeh, Asal, Daniela Salgueiro, Rita Branquinho, Joana Pinto, Henrique L. Gomes, Pedro Barquinha, Rodrigo Martins, and Elvira Fortunato. "Operational stability of solution based zinc tin oxide/SiO2 thin film transistors under gate bias stress." Apl Materials. 3 (2015). AbstractWebsite
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Fortunato, E., P. Barquinha, and R. Martins. "Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances." Advanced Materials. 24 (2012): 2945-2986. AbstractWebsite
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Fortunato, E., L. Pereira, P. Barquinha, I. Ferreira, R. Prabakaran, G. GONCALVES, A. Goncalves, and R. Martins. "Oxide semiconductors: Order within the disorder." Philosophical Magazine. 89 (2009): 2741-2758. AbstractWebsite
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