Influence of post-annealing temperature on the properties exhibited by ITO, IZO and GZO thin films

Citation:
GONCALVES, G., E. Elangovan, P. Barquinha, L. Pereira, R. Martins, and E. Fortunato. "Influence of post-annealing temperature on the properties exhibited by ITO, IZO and GZO thin films." Thin Solid Films. 515 (2007): 8562-8566.

Abstract:

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Notes:

Times Cited: 711st International Symposium on Transparent Conducting OxidesOct 23-25, 2006Crete, GREECEPerfecture Heraklion; Univ Crete, Phys Dept; Fdn Res & Technol Inst Elect Struture & Lasers

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